Sensitivity analysis of the complete electrode model for electrical impedance tomography

Electrical impedance tomography (EIT) is an imaging technique that reconstructs the conductivity distribution in interior of object using electrical measurements from electrodes are attached around boundary. The Complete Electrode Model (CEM) accurately incorporates electrode size, shape, and effective contact into forward problem for EIT. In this work, effect on solution addressed. particular, sensitivity electric potential with respect to a small-amplitude perturbation conductivity, some defective studied. Gâteaux derivative introduced as tool analysis differentiability proved. then expressed unique variational discretization performed Finite Elements type P1. Numerical simulations different 2D 3D configurations presented. This study illustrates impact presence perturbations parameters CEM EIT measurements. Finally, inverse numerically solved results confirm conclusions numerical analysis.